Location

Snowbird, UT, USA

Start Date

1-1-1999 12:00 AM

Description

X-ray backscatter tomography (XBT), based on the detection of Compton scattering, has been applied to a variety of NDE problems with varying success. Its strength is its applicability with access to only one side of an object. The method is limited, however, to the detection of features near the surface of relatively light materials. When used to inspect structured or dense materials, XBT is plagued by superposition artifacts and limited by attenuation and noise. We often investigate the feasibility of using XBT for particular applications by trial and error, acquiring data from material specimens using varying inspection parameters.

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

18B

Chapter

Chapter 7: New Techniques and Applications

Section

New Techniques, Applications, and Devices

Pages

2055-2062

DOI

10.1007/978-1-4615-4791-4_263

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Characterization of X-Ray Backscatter Tomography System Performance

Snowbird, UT, USA

X-ray backscatter tomography (XBT), based on the detection of Compton scattering, has been applied to a variety of NDE problems with varying success. Its strength is its applicability with access to only one side of an object. The method is limited, however, to the detection of features near the surface of relatively light materials. When used to inspect structured or dense materials, XBT is plagued by superposition artifacts and limited by attenuation and noise. We often investigate the feasibility of using XBT for particular applications by trial and error, acquiring data from material specimens using varying inspection parameters.