Event Title

A Real-Time Phase Unwrapping Algorithm For EPSI Material Deformation Measurements

Location

Snowbird, UT, USA

Start Date

1-1-1999 12:00 AM

Description

Electronic Phase-Stepped Interferometry (EPSI) is a laser-based NDE technique capable of providing out-of-plane displacement and surface topography measurements on the order of a nanometer [1]. The technique has the potential for providing real-time measurement capabilities provided data capture and data reduction rates could be minimized. This in turn could provide an opportunity for studying and characterizing surface defect information in advanced materials such as Ti-6A1-4V and A120204-T3 using time-sequenced studies and methods. The possibility of characterizing defect precursor information may then become possible through time-evolution history studies.

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

18A

Chapter

Chapter 3: Simulations, Signal Processing, Tomography, and Holography

Section

Signal Processing and Analysis

Pages

759-764

DOI

10.1007/978-1-4615-4791-4_97

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

A Real-Time Phase Unwrapping Algorithm For EPSI Material Deformation Measurements

Snowbird, UT, USA

Electronic Phase-Stepped Interferometry (EPSI) is a laser-based NDE technique capable of providing out-of-plane displacement and surface topography measurements on the order of a nanometer [1]. The technique has the potential for providing real-time measurement capabilities provided data capture and data reduction rates could be minimized. This in turn could provide an opportunity for studying and characterizing surface defect information in advanced materials such as Ti-6A1-4V and A120204-T3 using time-sequenced studies and methods. The possibility of characterizing defect precursor information may then become possible through time-evolution history studies.