Start Date

2016 12:00 AM

Description

Sonic Infrared Imaging (SIR) technology is a relatively new NDE technique that has received significant acceptance in the NDE community. SIR NDE is a super-fast, wide range NDE method. The technology uses short pulses of ultrasonic excitation together with infrared imaging to detect defects in the structures under inspection. Defects become visible to the IR camera when the temperature in the crack vicinity increases due to various heating mechanisms in the specimen. Defect detection is highly affected by noise levels as well as mode patterns in the image. Mode patterns result from the superposition of sonic waves interfering within the specimen during the sound pulse. Mode patterns can be a serious concern, especially in composite structures. Mode patterns can either mimic real defects in the specimen, or alternatively, hide defects if they overlap. In last year’s QNDE, we have presented algorithms to improve defects detectability in severe noise. In this paper, we will present our development of algorithms on defect extraction targeting specifically to mode patterns in SIR images.

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Further Development of Image Processing Algorithms to Improve Detectability of Defects in Sonic IR NDE

Sonic Infrared Imaging (SIR) technology is a relatively new NDE technique that has received significant acceptance in the NDE community. SIR NDE is a super-fast, wide range NDE method. The technology uses short pulses of ultrasonic excitation together with infrared imaging to detect defects in the structures under inspection. Defects become visible to the IR camera when the temperature in the crack vicinity increases due to various heating mechanisms in the specimen. Defect detection is highly affected by noise levels as well as mode patterns in the image. Mode patterns result from the superposition of sonic waves interfering within the specimen during the sound pulse. Mode patterns can be a serious concern, especially in composite structures. Mode patterns can either mimic real defects in the specimen, or alternatively, hide defects if they overlap. In last year’s QNDE, we have presented algorithms to improve defects detectability in severe noise. In this paper, we will present our development of algorithms on defect extraction targeting specifically to mode patterns in SIR images.