Degree Type

Dissertation

Date of Award

1987

Degree Name

Doctor of Philosophy

Department

Chemistry

First Advisor

R. S. Houk

Abstract

A new time-of-flight mass spectrometer (TOF-MS) has been developed for direct characterization of solid samples and fundamental studies. A N[subscript]2 laser ([lambda] = 337 nm) was used with the linear TOF-MS to study ion formation from various solid specimens. Improved techniques were incorporated for fast ion detection and data acquisition. For inorganic specimens the mass resolution was ~2000 at m/z = 400, a considerable improvement over earlier reports for instruments using a linear ion optical path;The TOF-MS was designed specifically to permit investigation of the information available from the individual TOF scans. The approach is described and results are given for the LD-TOF-MS spectra of CsI and a superconducting sample, YBa[subscript]2Cu[subscript]3O[subscript]7;Other improvements in laser excitation of specimens and detection methods for analytical mass spectrometry are also described. ftn*This work was performed under contract No. W-7405-Eng-82 with the U.S. Department of Energy.

DOI

https://doi.org/10.31274/rtd-180813-13081

Publisher

Digital Repository @ Iowa State University, http://lib.dr.iastate.edu/

Copyright Owner

Le Qun Huang

Language

en

Proquest ID

AAI8825472

File Format

application/pdf

File Size

140 pages

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