Date of Award
Doctor of Philosophy
R. S. Houk
A new time-of-flight mass spectrometer (TOF-MS) has been developed for direct characterization of solid samples and fundamental studies. A N[subscript]2 laser ([lambda] = 337 nm) was used with the linear TOF-MS to study ion formation from various solid specimens. Improved techniques were incorporated for fast ion detection and data acquisition. For inorganic specimens the mass resolution was ~2000 at m/z = 400, a considerable improvement over earlier reports for instruments using a linear ion optical path;The TOF-MS was designed specifically to permit investigation of the information available from the individual TOF scans. The approach is described and results are given for the LD-TOF-MS spectra of CsI and a superconducting sample, YBa[subscript]2Cu[subscript]3O[subscript]7;Other improvements in laser excitation of specimens and detection methods for analytical mass spectrometry are also described. ftn*This work was performed under contract No. W-7405-Eng-82 with the U.S. Department of Energy.
Digital Repository @ Iowa State University, http://lib.dr.iastate.edu/
Le Qun Huang
Huang, Le Qun, "Improved ionization sources and detection methods for analytical mass spectrometry " (1987). Retrospective Theses and Dissertations. 9751.