Campus Units
Statistics
Document Type
Article
Publication Version
Accepted Manuscript
Publication Date
2017
Journal or Book Title
Technometrics
Volume
59
Issue
2
First Page
202
Last Page
214
DOI
10.1080/00401706.2016.1172028
Abstract
Maintenance data can be used to make inferences about the lifetime distribution of system components. Typically, a fleet contains multiple systems. Within each system, there is a set of nominally identical replaceable components of particular interest (e.g., 2 automobile headlights, 8 dual in-line memory module (DIMM) modules in a computing server, 16 cylinders in a locomotive engine). For each component replacement event, there is system-level information that a component was replaced, but no information on which particular component was replaced. Thus, the observed data are a collection of superpositions of renewal processes (SRP), one for each system in the fleet. This article proposes a procedure for estimating the component lifetime distribution using the aggregated event data from a fleet of systems. We show how to compute the likelihood function for the collection of SRPs and provide suggestions for efficient computations. We compare performance of this incomplete-data maximum likelihood (ML) estimator with the complete-data ML estimator and study the performance of confidence interval methods for estimating quantiles of the lifetime distribution of the component. Supplementary materials for this article are available online.
Copyright Owner
American Statistical Association and the American Society for Quality
Copyright Date
2017
Language
en
File Format
application/pdf
Recommended Citation
Zhang, Wei; Tian, Ye; Escobar, Luis A.; and Meeker, William Q., "Estimating a Parametric Component Lifetime Distribution from a Collection of Superimposed Renewal Processes" (2017). Statistics Publications. 286.
https://lib.dr.iastate.edu/stat_las_pubs/286
Comments
This is an Accepted Manuscript of an article published by Taylor & Francis as Zhang, Wei, Ye Tian, Luis A. Escobar, and William Q. Meeker. "Estimating a parametric component lifetime distribution from a collection of superimposed renewal processes." Technometrics 59, no. 2 (2017): 202-214. DOI: 10.1080/00401706.2016.1172028. Posted with permission.